Some Selected Publications & Presentations:

 

BOOKS

Industrial Applications of Surface Analysis Techniques, (Unpublished ) Plenum Press, N.Y., 350 pages.

The Entrepreneurial Scientist: Starting and Running a High Technology Business., Plenum Press, N.Y., private presentation SEM Conference

Ion Scattering Spectroscopy in The Encyclopedia of Materials Characterization., Ed. Brundle, Evans, Wilson, 1991.

Application of ISS/SIMS in Characterizating Thin Layers (100A) of Surface Contaminants. Sparrow, Smith. in Surface Contamination. ed. K. Mittal

Interfacial Chemistry of Metal Films on Polymers: Diffusion, Oxidation, Trace Components Studied by XPS, ISS, and SIMS. Sparrow, Homstad, in Metallized Plastics, Mittal, Susko

Application of Surface Analytical Investigations in Understanding Interfacial Bonding in Metallized Plastics. In Metallized Plastics 7: Fundamentals & Applied Aspects., Mittal. 2001

PUBLICATIONS.

The Role of Surface Chemistry and VCI's in Early Stages of Metal Processing. Corrosion 95, National Association of Corrosion Engineers (NACE) Orlando, Fla. 1995

Quantitative Evaluation & Control of Surface Chemistyr Affection Electronics. ISS & SIMS Surface Analysis. The Electrochemical Society. Oct. 1994, Miami

Surface / Adhesion. Adhesion in Coatings: Technology & Characterization . Fed. of Society for Coatings. May 1994, Minneapolis.

Evaluation of Effects of VCI Organic Corrosion Inhibitors on Surface Chemistry of Metals. Miksic, Tarvin, Sparrow. National Association of Corrosion Engineers. (NACE) 1989

Detailed Examination of the Outer Surface by Combined Techniques: SIMS Combined with ISS and SEM, Amer.Soc. Mass Spectroscopy, 1979.

Practical Applications of Surface Technology to aCorrosion. Corrosion 83, National Association of Corrosion Engineeers. (NACE) 1983.

Ion Scattering Spectroscopy (ISS) for Surface and In-Depth Analysis of Glass, Haessler, E. and Sparrow, G.R. Silic. Ind., 43, 253-6, 1978

SIMS: Processing and Control, 3M Annual Conference on Ion Beam Surface Analysis, 1979.

Details in the Outer 50 Angstroms - Application of ISS and SIMS, Chicago Microbeam Analysis Society, 1979

Reconstructing the Outer few Angstroms of a Surface Using ISS and SIMS Techniques. Microbeam Analysis Society.

Combined ESCA - ISS - SIMS: A New Approach to Surface and Molecular Structure INvestigations, Amer. Chem. Soc., 1978

New Means for Extended Analysis of Metals, Alloys, and Composites: A Combination of ESCA, ISS, and SIMS. Pittsburgh Conf on Analytical Chemistry and Applied Spectroscopy, 1978

Characterizing and Controlling the Prepared or Conditioned Surface: New Surface Analytical Techniques. Instr. Soc. of Amer., 1978

Characterization of Thin Surface Layers and MOnolayers by ISS and Other Techniques, AMer. VAc. Soc., New Mexico, 1978

Surface Characterization of Metals, Polymers, and Composites by Combined Techniques: ISS, SIMS, SEM, and EDX. Microbeam Analysis Soc., 1978

Characterization of Cleaned and Prepared Bonding Surfaces by ISS/SIMS, 3M Symposium on Al, 1978 and Soc. of Manuf. Eng. 1978

Surface Contamination, Soc. of Manuf. Eng., 1978

Surface Analysis by HIgh Perfromance Ion Scattering Spectroscopy. Feder. Analytical Chem and Appl. Spect. Soc., 1976

A Simple Approach to Quantitative SIMS, Proc. Amer. Soc. of Mass Spect., 1976

Ions Working for You., Industrial Research., 1976

Characterization of Cleaned and Prepared Bonding Surfaces by ISS/SIMS. Inter. Conf. on Deburring and Surf. Conditioning. 1977

Quantitative SIMS Approximations for General Applications in Surface Analysis. Amer. Soc. of Mass Spect., 1977

Combined SIMS/SEM for Three Dimensional Surface Analysis, Inter.Elect.Micro.Soc and Micro. Analysis Soc. , 1977

Mass Spectra of P4O10. Anal. Chem. 1969

Mass Spectra of the SIlicon Tetrahalides: Metastable Ions, J.Chem.Soc., 1970

Design and Performance of a Magnetic Field Measuring Device Based on Hall Effect Crystals. Iowa State University, 1962